Application of spectral technique in the scanning probe microscopy: SFOM (scanning fluorescence optical microscope)

Authors
Bykov, VA Feklisov, SG Saunin, SA
Citation
Va. Bykov et al., Application of spectral technique in the scanning probe microscopy: SFOM (scanning fluorescence optical microscope), PHYS LOW-D, 3-4, 2001, pp. 25-30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF LOW-DIMENSIONAL STRUCTURES
ISSN journal
02043467 → ACNP
Volume
3-4
Year of publication
2001
Pages
25 - 30
Database
ISI
SICI code
0204-3467(2001)3-4:<25:AOSTIT>2.0.ZU;2-Q
Abstract
We report the technical characteristics and principle scheme of the SFOM (S canning Fluorescence Optical Microscope) "Nanofinder". This device is produ ced jointly by NT-MDT Co. (Russia) and Tokyo Instruments Inc. (Japan) and a llows using confocal optics to get Raman and photoluminescence spectra in e very XYZ point of the sample with spatial resolution up to 200 nm. The poss ible applications are fluorescence and Lifetime analysis of compounds, cont aminants, defects, and stress in semiconductors, films, liquid crystals, bi ological salines, etc.