Image contrast in the lateral force mode in multiphase nanomaterials

Citation
Ov. Carban et al., Image contrast in the lateral force mode in multiphase nanomaterials, PHYS LOW-D, 3-4, 2001, pp. 31-38
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF LOW-DIMENSIONAL STRUCTURES
ISSN journal
02043467 → ACNP
Volume
3-4
Year of publication
2001
Pages
31 - 38
Database
ISI
SICI code
0204-3467(2001)3-4:<31:ICITLF>2.0.ZU;2-U
Abstract
Peculiarities of the image contrast formation have been studied while inves tigating samples with different surface topography by lateral force microsc opy (LFM). The main contribution to the lateral image contrast has been sho wn to come from the chemical composition, which makes it possible to use th is method for distinguishing between structurally close nanophases. The con trast formation has been analyzed at various scan rates.