Theoretical method for construction of surface images in atomic force microscope

Universal theoretical method for construction of surface images in contact mode atomic-force microscope is proposed. This original method is based on molecular-dynamics imitation of a real scanning in constant force and const ant height modes. The method consists of several steps: (i) both the sample and the tip are constructed using interatomic potentials, (ii:) a series o f scannings are performed in both modes, and (iii) the surface images are b uilt. The results show that the images for both different tips and modes ar e different. The less the tip the higher the image contrast for isoforce su rfaces. The "true atomic" resolution can only be achieved with single-atomi c rather than multiatomic tips. Convolution effects are deafly observed for multiatomic tips.