AFM- and XPS-investigations of surface layers of nanocrystalline Fe-Cu-Nb-Si-B

Authors
Lomayeva, SF Kanunnikova, OM Povstugar, VI
Citation
Sf. Lomayeva et al., AFM- and XPS-investigations of surface layers of nanocrystalline Fe-Cu-Nb-Si-B, PHYS LOW-D, 3-4, 2001, pp. 271-276
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF LOW-DIMENSIONAL STRUCTURES
ISSN journal
02043467 → ACNP
Volume
3-4
Year of publication
2001
Pages
271 - 276
Database
ISI
SICI code
0204-3467(2001)3-4:<271:AAXOSL>2.0.ZU;2-I
Abstract
Atomic force microscopy and X-ray photoelectron spectroscopy were used to s tudy the surface layers of a nanocrystalline Fe-Cu-Nb-Si-B alloy. The grain size has been shown to increase when passing from bulk layers to the surfa ce from 20 to 200 nm, which is associated with the processes of the surface segregation of Si and B. Furthermore, during annealing and ion treatment t he processes of recrystallization occur on the surface.