Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using Raman spectroscopy, RBS and TEM

Authors
Ho, YW Ng, V Choi, WK Ng, SP Osipowicz, T Seng, HL Tjui, WW Li, K
Citation
Yw. Ho et al., Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using Raman spectroscopy, RBS and TEM, SCR MATER, 44(8-9), 2001, pp. 1291-1295
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
SCRIPTA MATERIALIA
ISSN journal
13596462 → ACNP
Volume
44
Issue
8-9
Year of publication
2001
Pages
1291 - 1295
Database
ISI
SICI code
1359-6462(20010518)44:8-9<1291:COGNIC>2.0.ZU;2-S