Element-selective mapping of magnetic moments in ultrathin magnetic films using a photoemission microscope

Citation
W. Kuch et al., Element-selective mapping of magnetic moments in ultrathin magnetic films using a photoemission microscope, SURF SCI, 480(3), 2001, pp. 153-162
Citations number
34
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
480
Issue
3
Year of publication
2001
Pages
153 - 162
Database
ISI
SICI code
0039-6028(20010601)480:3<153:EMOMMI>2.0.ZU;2-3
Abstract
We combine X-ray magnetic circular dichroism (XMCD) and photoelectron emiss ion microscopy to obtain locally resolved magnetic information on a microsc opic scale. Scanning the photon energy across elemental absorption edges an d recording microscopic images of the local secondary electron intensity fo r both photon helicities at each photon energy step allows to analyze local XMCD spectra at any position of the imaged area of the sample. With the he lp of magnetic sum-rules local quantitative information about magnetic mome nts can be extracted from such microspectroscopic measurements. The full po wer of XMCD as a spectroscopic tool is so maintained, while microscopic spa tial resolution is added. (C) 2001 Elsevier Science B.V. All rights reserve d.