M. Lejeune et al., Optical investigations and Raman scattering characterisation of carbon bonding in hard amorphous hydrogenated carbon films, THIN SOL FI, 389(1-2), 2001, pp. 233-238
Hydrogenated amorphous carbon films were prepared by plasma enhanced chemic
al vapour deposition (PECVD) of methane-argon (5%) gas mixtures at low pres
sure, in a dual electron cyclotron resonance (ECR)-rf glow discharge. Optic
al transmission spectroscopy, Raman spectroscopy, elastic recoil detection
analysis (ERDA) and infra-red (IR) absorption spectra were combined to exam
ine the relationship between the local microstructure (C-H and C-C bonds) a
nd the optical properties at different negative bias voltage. The amount of
bonded H, obtained by IR spectra, is higher in series deposited at low bia
s voltage, in qualitative agreement with the ERDA results. In ah cases, mos
t of the incorporated H is bonded to sp(3)C sites, with a predominance of C
H3 methyl groups. These results are also consistent with the Raman spectros
copy measurements. The positions, widths, and relative intensities of the t
wo characteristic features, the D and G peaks are found to vary systematica
lly with deposition conditions and film properties. The series prepared at
high bias voltage shows a higher disorder (D) over the graphitic (G) band r
atio, which also indicates a structure with a high disorder form of Csp(2)
sites. (C) 2001 Elsevier Science B.V. All rights reserved.