Jc. Nie et al., Stoichiometry and thickness distribution of BaCuO2 and CaCuO2 thin films by off-axis RF sputtering, THIN SOL FI, 389(1-2), 2001, pp. 261-266
We have systematically studied the stoichiometry and thickness distribution
of BaCuO2 and CaCuO2 thin films deposited by off-axis RF magnetron sputter
ing. We found a strong dependence of the thickness and composition on axial
distance from the target. A gradual and quasi-linear dependence was observ
ed at an axial distance of 70 mm from the target. There is a minimum in the
variation of both thickness and composition for all cases at axial distanc
es of 75-95 mm from the target. In this region, the observed thickness drop
-off and compositional uniformity over a distance of 20 mm were within 30 a
nd 10%, respectively. Also the variation in the lateral direction was impro
ved within 10% in thickness and 15% in composition, respectively, for a lat
eral move of 10 mm from the normal axis of the target. A stoichiometrically
uniform region as large as 20 x 20 mm(2) was achieved in the optimum regio
n. By selecting a proper region from the target, and by adjusting the targe
t composition according to the stoichiometric distribution, we were able to
obtain ideal film growth with a controllable deposition rate, yielding a l
arge area of homogeneous thickness and composition, with the required stoic
hiometry. (C) 2001 Elsevier Science B.V. All rights reserved.