Y. Zhu et al., Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging, ULTRAMICROS, 87(3), 2001, pp. 135-145
We have shown that energy-loss spectroscopy in a medium-voltage transmissio
n electron microscope can measure concentrations of boron tin a carbon matr
ix) down to 0.2 %, with 10% accuracy. The detection limit is determined by
electron-beam shot-noise statistics and by gain variations in the photodiod
e or charge-coupled-diode array. (C) 2001 Elsevier Science B.V. All rights
reserved.