In this study thin Si(1 1 1) sample was prepared for top view observations
by high resolution transmission electron microscopy (HRTEM). The very first
steps of diamond nucleation on Si(1 1 1) by a HFCVD process are studied. W
e detect the polycrystalline growth of silicon carbide grains with a genera
l pseudoepitaxic orientation SiC{2 2 0}//Si{2 2 0}. They are relied by diso
riented SiC grains. (C) 2001 Elsevier Science B.V. All rights reserved.