Polar-angle dependence of the X-ray fluorescence intensity from a Pd single crystal

Citation
S. Harada et al., Polar-angle dependence of the X-ray fluorescence intensity from a Pd single crystal, BUNSEKI KAG, 50(6), 2001, pp. 405-410
Citations number
10
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
BUNSEKI KAGAKU
ISSN journal
05251931 → ACNP
Volume
50
Issue
6
Year of publication
2001
Pages
405 - 410
Database
ISI
SICI code
0525-1931(200106)50:6<405:PDOTXF>2.0.ZU;2-1
Abstract
We can obtain from X-ray fluorescence holography (XFH) direct three-dimensi onal atomic images around those atoms emitting the X-ray fluorescence, beca use XFH has both intensity and phase information. We measured the X-ray flu orescence intensity of a Pd (1 0 0) single crystal and investigated the pol ar-angle dependence after performing simulations to check the effect of the Savitzky-Golay smoothing method. We also introduce also our simulation pro cess.