Web-based mining of statistical information

This paper outlines the techniques used for automating the process of regul arly generating statistical summaries as well as control charts for a large number of semiconductor process steps by integrating the capabilities of S AS, Unix, OpenVMS, Promis and HTML. The resulting information, including ov er 1200 control charts, is updated daily without human intervention, and ma de available in a user-friendly manner on the SPC Website. The sole statist ician can thus devote his time to activities that need his personal attenti on. Texas Instruments,(2) is in the process of patenting the automation tec hnology that has been summarized in this paper. (C) 2001 Elsevier Science B .V. All rights reserved.