Next generation functional test program development system

While superior-quality functional board test has been a goal for most high reliability electronics manufacturers, the time and effort For generating s uch test programs using today's tools and processes makes this difficult to achieve in a cost effective manner. This paper will introduce a revolution ary approach to functional board test program development that combines the comprehensiveness of software-based simulation with the speed and simplici ty of hardware emulation. The result is a functional Test Program Set devel opment system that can produce high fault coverage, diagnostic test program s in a fraction of the time it takes using traditional techniques, and at a lower unit cost. In this paper we will first provide a brief background on the strengths and weaknesses of current software and hardware TPS development techniques-sim ulation hot mock-up. Next, the new approach will be described in detail and contrasted against the existing techniques. Finally, we will present actua l experience to date using a prototyped system.