The physics of determining chip reliability

Authors
Hess, K Haggag, A McMahon, W Cheng, K Lee, J Lyding, J
Citation
K. Hess et al., The physics of determining chip reliability, IEEE CIRC D, 17(3), 2001, pp. 33-38
Citations number
18
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE CIRCUITS & DEVICES
ISSN journal
87553996 → ACNP
Volume
17
Issue
3
Year of publication
2001
Pages
33 - 38
Database
ISI
SICI code
8755-3996(200105)17:3<33:TPODCR>2.0.ZU;2-A