Refinement of modulated structures against X-ray powder diffraction data with JANA2000

Citation
M. Dusek et al., Refinement of modulated structures against X-ray powder diffraction data with JANA2000, J APPL CRYS, 34, 2001, pp. 398-404
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
34
Year of publication
2001
Part
3
Pages
398 - 404
Database
ISI
SICI code
0021-8898(200106)34:<398:ROMSAX>2.0.ZU;2-K
Abstract
JANA is a computer program for the refinement and analysis of periodic and aperiodic (incommensurately modulated structures and composite crystals) cr ystal structures. Here a new module is introduced that allows Rietveld refi nements against powder diffraction data. It is shown that JANA2000 provides a state-of-the-art description of the peak profiles. A re-analysis of the low-temperature structure of (CO)(x)C-60 showed that the application of ico sahedral symmetry restrictions to the C-60 molecule leads to a better descr iption of the electron density and to a corrected position of the CO molecu le as compared with a rigid-body refinement. The incommensurately modulated structure of NbTe4 has been successfully refined against X-ray powder diff raction data. The structural parameters are equal to, but less accurate, th an the parameters obtained from a single-crystal study.