Direct measurement of microkeratome gap width by electron microscopy

Authors
Citation
Ky. Liu et Dsc. Lam, Direct measurement of microkeratome gap width by electron microscopy, J CAT REF S, 27(6), 2001, pp. 924-927
Citations number
4
Categorie Soggetti
Optalmology
Journal title
JOURNAL OF CATARACT AND REFRACTIVE SURGERY
ISSN journal
08863350 → ACNP
Volume
27
Issue
6
Year of publication
2001
Pages
924 - 927
Database
ISI
SICI code
0886-3350(200106)27:6<924:DMOMGW>2.0.ZU;2-G
Abstract
Purpose: To perform an accurate direct measurement of the microkeratome gap width using scanning electron microscopy (SEM). Setting: Electron Microscope Unit, University of Hong Kong, Hong Kong, Chin a. Methods: The Cambridge Stereoscan S440 scanning electron microscope was use d to measure the gap width of 4 SCMD microkeratomes with high accuracy(+/-1 .5 mum). Results: The manufacturer's gap specification for the 4 microkeratomes was 150.0 mum. The gap width measurements using SEM were 164.7 mum, 190.0 mum, 200.6 mum, and 145.9 mum and the respective errors, 9.8%, 26.7%, 33.7%, and 2.7%. Two of the 4 microkeratomes had more than a 25% error in gap width f rom the specification. Conclusions: The great variation in gap width from the manufacturer's speci fication for the 4 SCMD microkeratomes was beyond the standard of tolerance normally accepted in laser in situ keratomileusis (LASIK). Many unexpected LASIK-related keratectasia and corneal perforations may be related to subs tandard microkeratome manufacturing and calibration. All new microkeratomes and blades should be validated before use to avoid keratectasia and other flap problems in LASIK. J Cataract Refract Surg 2001, 27.. 924-927 (C) 2001 ASCRS and ESCRS.