Electron momentum spectroscopy has been used to measure the electronic
structure of aluminium after exposure to increasing amounts of oxygen
. The experimental valence band results showed the structural features
of aluminium oxide beginning to dominate the free electron contributi
on of metallic aluminium as the exposure increased. The interpretation
of this is that the aluminium oxide layer increases in thickness as t
he exposure increases, eventually saturating at a thickness of about 5
Angstrom. After subtracting the intensity of the underlying Al metal
contribution from the oxidised states the valence band features of alu
minium oxide were resolved even after exposure to only 600 L of oxygen
. It is estimated that only about 5 A of aluminium oxide is formed at
this stage. A quantitative comparison was made to a linear muffic-tin
orbital (LMTO) calculation for spherically averaged alpha-Al2O3. Best
agreement was obtained for the results of the lowest oxygen exposure (
600 L). The chemical shifts of the Al 2p core level were also measured
in separate experiments for two intermediate oxygen exposures between
the aluminium and aluminium oxide cases for further characterisation.
These measurements show that electron momentum spectroscopy is able t
o obtain the electron bands and the momentum densities of very thin di
sordered surface layers. (C) 1997 Elsevier Science B.V.