Formation of large-grained uniform poly-Si films on glass at low temperature

Citation
Ag. Aberle et al., Formation of large-grained uniform poly-Si films on glass at low temperature, J CRYST GR, 226(2-3), 2001, pp. 209-214
Citations number
15
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
226
Issue
2-3
Year of publication
2001
Pages
209 - 214
Database
ISI
SICI code
0022-0248(200106)226:2-3<209:FOLUPF>2.0.ZU;2-D
Abstract
The formation of device-grade polycrystalline silicon (poly-Si) films on lo w-cost substrates at low temperature using simple and fast processes is of enormous interest for photovoltaics and lar ge-area electronics. In this pa per we report the realisation of thick (similar to 5 mum), large-grained (s imilar to 5 mum), uniform poly-Si films on glass at a substrate temperature below 650 degreesC. This important technological progress was achieved by using ion-assisted deposition of silicon for thickening a thin poly-Si seed ing layer grown on glass by aluminium-induced crystallisation of amorphous silicon. (C) 2001 Elsevier Science B.V. All rights reserved.