Single crystals of a recent ferroelectric material, glycine phosphite were
grown from aqueous solution employing the techniques of slow cooling and co
ntrolled evaporation. Powder X-ray diffraction studies as well as thermal a
nalysis were carried out on the grown crystals. The morphology of the cryst
al has been determined using contact and optical goniometry. The mechanical
hardness of the crystal was evaluated by Vickers indentation method. Thick
ness dependence of the dielectric properties has been investigated and the
results can be interpreted in terms of a surface layer of lower dielectric
constant. (C) 2001 Elsevier Science B.V. All rights reserved.