Completely (0 0 1)-oriented Pb(Zr0.52Ti0.48)O-3 (PZT) thin films deposited
on (1 0 0)-silicon wafers with SrTiO3 (STO)/MgO as a buffer layer system an
d YBCO as a electrode, were prepared by using KrF excimer pulsed-laser depo
sition. The epitaxial relationships, i.e. PZT(0 0 1)parallel to YBCO(0 0 1)
parallel to SrTiO3(1 0 0)parallel to MgO(1 0 0)parallel to Si(1 0 0) and PZ
T(1 1 0) parallel to YBCO(1 1 0)parallel to SrTiO3(0 1 1)parallel to MgO(0
0 1)were detected using X-ray theta -2 theta scans and pole figures or phi
-scans. Grain size and surface morphologies of the as-prepared films were e
xamined using atomic force microscopy and scanning electron microscopy. (C)
2001 Published by Elsevier Science B.V.