Epitaxial ZnO films were grown on two polar surfaces (O-surface and Zn-surf
ace) of (0 0 0 1) ZnO single crystal substrates using off-axis magnetron sp
uttering deposition. As a comparison, films were also deposited on (0 0 0 1
) Al2O3 substrates. It was found that the two polar ZnO surfaces have diffe
rent photoluminescence (PL) spectrum, surface structure and morphology, whi
ch strongly influence the epitaxial film growth. The morphology and structu
re of homoepitaxial films grown on the ZnO substrates were different from h
eteroepitaxial films grown on the Al2O3 An interesting result shows that hi
gh temperature annealing of ZnO single crystals will improve the surface st
ructure on the O-surface rather than the Zn-surface. The measurements of PL
, low-angle incident X-ray diffraction, and atomic force microscopy of ZnO
films indicate that the O-terminated surface is better for ZnO epitaxial fi
lm growth. (C) 2001 Published by Elsevier Science B.V.