FTIR spectroscopy measurements indicate a presence of high concentration hy
drogen existing in the liquid encapsulated Czochralski grown undoped InP wa
fers. These undoped InP can be annealed to be semi-insulating (SI) reproduc
ibly. Hydrogen can facilitate the formation of anti-site defects in InP and
can also induce electrically-active hydrogen related defects. The annealed
behavior of InP is proved possible to be originated from the neutralizatio
n effect of hydrogen that is supplied by the dissociation of hydrogen compl
exes in the process of annealing. The process of hydrogen passivation of do
nors is discussed. Besides neutralizing impurities and defects in InP, hydr
ogen induces new hydrogen related defects in the band gap, and can also act
ivate the formation of complexes involving p(In), so it plays an important
role in the charge compensation process in SI InP obtained by high temperat
ure annealing. (C) 2001 Elsevier Science B.V. All rights reserved.