Sulphur-terminated silicon surfaces for the epitaxial growth of chalcopyrite semiconductors

Citation
H. Metzner et T. Hahn, Sulphur-terminated silicon surfaces for the epitaxial growth of chalcopyrite semiconductors, J CRYST GR, 225(2-4), 2001, pp. 354-358
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
225
Issue
2-4
Year of publication
2001
Pages
354 - 358
Database
ISI
SICI code
0022-0248(200105)225:2-4<354:SSSFTE>2.0.ZU;2-F
Abstract
As an alternative to wet chemical treatments and hydrogen termination, we p ropose the sulphur-termination of silicon surfaces in order to obtain favou rable starting conditions for epitaxial growth of chalcopyrite semiconducto rs. We show that a high-temperature treatment of Si(0 0 1) and Si(1 1 1) in ultra-high vacuum under continuous exposure to a reactive sulphur molecula r beam from a cracker source leads to new well-defined ordered surfaces. We identify the ideal sulphur termination of Si(0 0 1) with (1 x 1) structure and a quasi-ideal termination of Si(1 1 1) with a (4 x 4) surface structur e. We propose structural models and discuss three surfaces also in the ligh t of former experimental effort and theoretical predictions. Furthermore, w e elucidate the implications of sulphur termination for epitaxial growth of the CIS compound. (C) 2001 Elsevier Science B.V. All rights reserved.