A novel simultaneous unipolar multispectral integrated technology approachfor HgCdTeIR detectors and focal plane arrays

In the last few years Rockwell has developed a novel simultaneous unipolar multispectral integrated HgCdTe detector and focal plane array technology t hat is a natural and relatively straightforward derivative of our baseline double layer planar heterostructure (DLPH) molecular beam epitaxial (MBE) t echnology. Recently this technology was awarded a U.S. patent. This simulta neous unipolar multispectral integrated technology (SUMIT) shares the high performance characteristics of its DLPH antecedent. Two color focal plane a rrays with low-10(13) cm(-2)s(-1) background limited detectivity performanc e (BLIP D*) have been obtained for mid-wave infrared (MWIR, 3-5 mum) device s at T > 130 K and for long-wave infrared (LWIR, 8-10 mum) devices at T sim ilar to 80 K.