Temperature dependence of conductivity sigma and Hall coefficient R-H is me
asured by DC and AC methods at temperatures between 600-1180 degreesC. Two
experimental approaches are used.(1) Galvanomagnetic measurements at define
d temperature and Cd or Te pressure are performed in solid samples in the w
hole field of stability of solid in the pressure-temperature (P-T) diagram.
(2) Galvanomagnetic measurements define temperature both in solid and in li
quid phase. The typical semiconducting character of sigma and 1/ \ eR(H)\ ,
when both parameters increase with temperature, is observed also in the liq
uid. The negative sign of R-H is observed above 600 degreesC within the who
le region of stability of solid, both at Cd and at Te saturation, and R-H <
0 both in solid and liquid. 1/<vertical bar>eR(H)\ reaches 5 x 10(19) cm(-
3) at 1180 degreesC and the corresponding Hall mobility is 20 cm(2)/Vs. Thr
ee slopes characterize the temperature dependence of a 0.7 eV in the solid
CdTe below the melting point 1092 degreesC and 4.6 eV in the liquid phase a
t 1092 degreesC < T < 1160 degreesC. Above 1160 degreesC, conductivity incr
eases moderately with the slope 0.8 eV. The experimental data for solid CdT
e are evaluated by a theoretical model, including electrons from both the c
entral minimum (T-point) and four satellite minima (L-point) of the Brillou
in zone. The ab initio results fit our experimental data after small modifi
cations very well.