HgCdTe 2D arrays are needed in both medium (MW) and long (LW) wavebands for
imaging, search, and track and guidance applications. Often the detector i
s the performance-limiting component in the system, and it is necessary to
use detectors with very low excess noise and few defective pixels. Normally
the detector is cooled sufficiently to freeze-out thermally generated leak
age currents, so the main interest is to understand the mechanisms that det
ermine the general detector performance and the cause of defective pixels.
This paper describes the detector technology and the ion beam junction-form
ing process. The fundamental performance limits of homojunction HgCdTe tech
nology and the doping levels needed to produce a detector with impact-ioniz
ation limited performance are discussed. Extensive studies have been made o
n defective pixels in long wavelength arrays and some technologies for redu
cing them are described here. Defective pixels have been found to be associ
ated with material dislocations crossing the p-n junction and a model has b
een proposed for the noise-generating mechanism.