Analysis of fluorescent and Raman spectra with spatial resolution (depth analysis) method

A depth analysis spectra method for researching fluorescent and Raman spect ra was developed since a self-absorption was often observed in fluorescent spectra of thick solid sample. The intensity change of self-absorption coul d be observed to explore the secrets of solid state spectra by depth analys is method. The Raman and fluorescent spectra of Nd3+:YAG crystal were measu red with 633nm of HN laser and 514. 5nm of Ar+ laser. Some fluorescent line s which possess self-absorption were observed, whose intensity changes with depth of confocal plane. It shows that spatial resolution (depth analysis) method is a powerful experimental means for studying solid state spectrosc opy.