Phase analysis of PZT 52/48 thin films by synchrotron XRD

Authors
Liu, Y Xu, C Liu, H Toraya, H Watanabe, T
Citation
Y. Liu et al., Phase analysis of PZT 52/48 thin films by synchrotron XRD, J MAT SCI L, 20(10), 2001, pp. 933-935
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
20
Issue
10
Year of publication
2001
Pages
933 - 935
Database
ISI
SICI code
0261-8028(200105)20:10<933:PAOP5T>2.0.ZU;2-M