I. Nakai et al., Use of highly energetic (116 keV) synchrotron radiation for X-ray fluorescence analysis of trace rare-earth and heavy elements, J SYNCHROTR, 8, 2001, pp. 1078-1081
This study has revealed the advantages of the use of 116 keV X-rays as an e
xcitation source of X-ray fluorescence (XRF) analyses. This technique is su
itable for nondestructive multielemental analyses of heavy elements such as
rare-earth elements. The lowest MDL value evaluated for the bulk analysis
of a JG-1 standard reference sample (granite rock) was 0.1 ppm for W for a
500 s measurement. The spectrum of standard glass samples of SRM612 demonst
rated clearly resolved K-line peaks of more than 30 elements, including all
the existing rare-earth elements, at 50 ppm levels. The calibration curve
for the determination of a rare-earth element shows a linear relation betwe
en the XRF intensity and concentrations from 10 to 0.03 ng. This powerful t
echnique should be useful for nondestructive analyses of rare-earth and hea
vy elements in geological, geochemical and archaeological samples as well a
s industrial materials.