The use of a tungstic oxide semiconductor as a sensor for ozone at concentr
ation levels relevant to atmospheric monitoring applications is an importan
t advance in attempts to produce cheap, lightweight and reliable instrument
s. Problems of stability are a possible obstacle to this application. A mod
el that describes the response of these sensors to ozone is proposed here a
nd using it an explanation for the drift of resistance with time at constan
t concentrations of ozone is given. Consideration of this drift model enabl
es a measurement routine to be employed that compensates for the drift obse
rved experimentally, thus producing a reliable calibration of the sensor.