Electro-thermal simulation of microsystems with mixed abstraction modelling

Citation
M. Jakovljevic et al., Electro-thermal simulation of microsystems with mixed abstraction modelling, MICROEL REL, 41(6), 2001, pp. 823-835
Citations number
35
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
6
Year of publication
2001
Pages
823 - 835
Database
ISI
SICI code
0026-2714(200106)41:6<823:ESOMWM>2.0.ZU;2-D
Abstract
Electro-thermal coupling is only one aspect of numerous interactions betwee n physical domains in microsystems. Different physical effects govern the f unctionality of microsystems and the system-level modelling using standard electro-thermal tools is not easy. In order to predict potential failures i n microsystem designs and reduce the costs of prototyping, it is important to involve the simulation of electro-thermal effects at the system level, e arly in the design process. Also, it is necessary to conduct a final verifi cation of the complete system with all governing subsystems, This paper con siders different issues of electro-thermal modelling for microsystems and p roposes analogue simulators with hardware description languages as a tool f or the system-level modelling, With increasing system complexity, the mixed abstraction modelling is the only way to achieve an optimal blend of the a ccuracy and the speed. (C) 2001 Elsevier Science Ltd. All rights reserved.