Electronic sputtering by swift highly charged ions of nitrogen on amorphous carbon

Citation
M. Caron et al., Electronic sputtering by swift highly charged ions of nitrogen on amorphous carbon, NUCL INST B, 179(2), 2001, pp. 167-175
Citations number
22
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
179
Issue
2
Year of publication
2001
Pages
167 - 175
Database
ISI
SICI code
0168-583X(200107)179:2<167:ESBSHC>2.0.ZU;2-Y
Abstract
Electronic sputtering with heavy ions asa function of both electronic energ y loss dE/dx and projectile charge state q was studied at the French heavy ion accelerator GANIL. Amorphous carbon (untreated, and sputter-cleaned and subsequently exposed to nitrogen) was irradiated with swift highly charged ions (Z = 6-73, q = 6-54, energy 6-13 MeV/u) in an ultrahigh vacuum scatte ring chamber. The fluence dependence of ibn-induced electron yields allows to deduce a desorption cross-section a which varies approximately as sigma similar to'(dE/du)(1.65) or sigma similar to q(3.3) for sputter-cleaned amo rphous carbon exposed to nitrogen. This q dependence is close to the cubic charge dependence observed for the emission of H+ secondary ions which are believed to be emitted from the very surface. However, the power law sigma similar to (dE/dx)(1.65), related to the electronic energy loss gives the b est empirical description. The dependence on dE/dx is close to a quadratic one thus rather pointing towards a thermal evaporation-like effect. (C) 200 1 Elsevier Science B.V. All rights reserved.