Ion beam modification of thermal stress resistance of MgO single crystals with different crystallographic faces

Citation
Vn. Gurarie et al., Ion beam modification of thermal stress resistance of MgO single crystals with different crystallographic faces, NUCL INST B, 178, 2001, pp. 138-143
Citations number
10
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
178
Year of publication
2001
Pages
138 - 143
Database
ISI
SICI code
0168-583X(200105)178:<138:IBMOTS>2.0.ZU;2-5
Abstract
Ion beam modification of thermal shock stress resistance of MgO single crys tals with various crystallographic faces is investigated. The most stable c rystal faces in terms of stress and damage resistance are established. Ion implantation is shown to reduce the temperature threshold of fracture for a ll crystal faces tested. The (1 1 1) face is demonstrated to be of highest stability compared to (1 1 0) and (1 0 0) faces in both implanted and unimp lanted crystals. At the same time ion implantation substantially increases the microcrack density for all the faces tested and reduces the degree of f racture damage following thermal shock. The theoretical resistance paramete rs for various crystal faces are calculated using the continuum mechanics a pproach, The results are discussed on the basis of fracture mechanics princ iples and the effect of the implantation-induced lattice damage on crack nu cleation. (C) 2001 Elsevier Science B.V. All rights reserved.