Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films

Authors
Peng, NH Jeynes, C Webb, RP Chakarov, IR Blamire, MG
Citation
Nh. Peng et al., Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films, NUCL INST B, 178, 2001, pp. 242-246
Citations number
5
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
178
Year of publication
2001
Pages
242 - 246
Database
ISI
SICI code
0168-583X(200105)178:<242:MCSOMI>2.0.ZU;2-V
Abstract
Monte Carlo simulations of irradiation damage profiles in high aspect ratio Nb masked YBa2Cu3O7-delta thin film reveal an improved damage profile when O+ beams are used instead of proton beams. The overall damage profile is i nsensitive to either beam divergence or beam misalignment but the damage ac cumulation levels are significantly affected by these effects. (C) 2001 Els evier Science B.V. All rights reserved.