High fluence ion beam modification of polymer surfaces: EPR and XPS studies

Citation
Vn. Popok et al., High fluence ion beam modification of polymer surfaces: EPR and XPS studies, NUCL INST B, 178, 2001, pp. 305-310
Citations number
17
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
178
Year of publication
2001
Pages
305 - 310
Database
ISI
SICI code
0168-583X(200105)178:<305:HFIBMO>2.0.ZU;2-T
Abstract
Polyethylene, polyamide-6 and polyimide foils implanted with 100 keV B+, P and Sb+ ions to a fluence range of 10(15)-10(17) cm(-2) have been studied using the electron paramagnetic resonance (EPR) and X-ray photoelectron spe ctroscopy (XPS) methods. The experimental data allow the comparison of the implantation-induced changes both in a given polymer foil under different i on beam regimes and in different polymers under similar ion-bombardment con ditions. The high fluence implantation of boron ions. depositing energy mai nly via electronic stopping, was found to be accompanied with the effective formation of K-bonded carbon-rich clusters, By contrast, heavier (phosphor us and antimony) ions, which deposit energy predominantly in nuclear collis ions. produced a lower concentration of x-radicals and a less carbonised to p surface layer. The peculiarities and main trends of the alterations of th e polymer structure and composition induced via electronic and nuclear stop ping have also been discussed. (C) 2001 Elsevier Science B,V. All rights re served.