Resonant interaction of light with a thin film of three-level atoms

Refraction of a double-frequency optical pulse at the interface between two linear dielectrics containing a thin film of resonant atoms is considered. The dynamics of the system is treated based on the model of three-level at oms with the V-type energy diagram. Refraction of short and long (compared with the Rabi oscillation period) pulses is analyzed with allowance for loc al-field effects. In both cases. the shape of the pulse corresponding to on e carrier wave frequency is shown to depend on the energy of the pulse with the other carrier wave frequency. In particular, both the frequency and th e depth of the amplitude modulation arising in the refracted pulse are chan ged. (C) 2001 MAIK "Nauka/Interperiodica".