The setup and first successful tests of an interference contrast microscope
operating at a photon energy of 4 keV (lambda = 0.31 nm) is described, The
interference contrast microscope is based on the full-field X-ray microsco
pe operating at the ID21 beamline at the European Synchrotran Radiation Fac
ility with the difference that two zone plates are used for the image gener
ation instead of one. One of the zone plate generates the X-ray image, both
together accomplish the "common path" beam splitting. With a suited config
uration, the interference pattern generated by the first orders of the two
zone plates is superposed by the X-ray image. Polymer test objects were use
d to detect phase shifts superposed to X-ray microscopy images employing th
e interference contrast mode. (C) 2001 Elsevier Science B.V, All rights res
erved.