Structural characterization of thin film photonic crystals - art. no. 235111

Citation
G. Subramania et al., Structural characterization of thin film photonic crystals - art. no. 235111, PHYS REV B, 6323(23), 2001, pp. 5111
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6323
Issue
23
Year of publication
2001
Database
ISI
SICI code
0163-1829(20010615)6323:23<5111:SCOTFP>2.0.ZU;2-O
Abstract
We quantitatively analyze the structure of thin film inverse-opal photonic crystals composed of ordered arrays of air pores in a background of titania . Ordering of the sphere template and introduction of the titania backgroun d were performed simultaneously in the thin film photonic crystals. Nondest ructive optical measurements of backfilling with high refractive index liqu ids, angle-resolved reflectivity, and optical spectroscopy were combined wi th band-structure calculations. The analysis reveals a thin film photonic c rystal structure with a very high filling fraction (92-94%) of air and a su bstantial compression along the c axis (similar to 22-25%).