Measurement of the mechanical loss of crystalline samples using a nodal support

Authors
Numata, K Bianc, GB Tanaka, M Otsuka, S Kawabe, K Ando, M Tsubono, K
Citation
K. Numata et al., Measurement of the mechanical loss of crystalline samples using a nodal support, PHYS LETT A, 284(4-5), 2001, pp. 162-171
Citations number
17
Categorie Soggetti
Physics
Journal title
PHYSICS LETTERS A
ISSN journal
03759601 → ACNP
Volume
284
Issue
4-5
Year of publication
2001
Pages
162 - 171
Database
ISI
SICI code
0375-9601(20010611)284:4-5<162:MOTMLO>2.0.ZU;2-M
Abstract
We measured the mechanical loss of crystalline anisotropic samples (silicon and sapphire) using a nodal support. The measured quality factor of the si licon sample reached 1.0 x 10(8) at room temperature. The sapphire sample s howed lower quality factors, 6.4 x 10(7) at most, which were analytically c onfirmed to be dominated by surface loss. (C) 2001 Elsevier Science B.V. Al l rights reserved.