Ultra-high molecular-weight polyethylene (UHMWPE) was treated by fast atom
beams (FAB) obtained from He, Ar, H, and N-2 With about 1 kV accelerating v
oltage and estimated fluence of 10(17) particles cm(-2). The modified surfa
ce layers were characterised by X-ray photoelectron spectroscopy (XPS or ES
CA) and dynamic microhardness measurements. Each applied FAB treatment resu
lts in the increase of the bulk plasmon loss energy (E,) of the C Is peak.
This implies the formation of graphitic-type material and/or hydrogenated a
morphous carbon (or carbon nitride in case of treatment by N atoms) in the
modified surface layer. FAB treatment by N atoms leads to the incorporation
of approximate to 35 at.% of N, which is about three times higher than the
value obtained previously after low-kilo-electron-volt N: ion-beam treatme
nt. The related C Is peak shows that the overwhelming portion of C is bound
to N, while the N Is peak reflects that N is present in at least three che
mical bonding states. Angle-dependent XPS studies of the nitrogen-FAB-treat
ed UHMWPE reveal the presence of a N-rich subsurface layer with a topmost l
ayer containing less N. This is in agreement with the calculated depth dist
ribution of N atoms. Each applied FAB treatment leads to significant increa
se in the surface microhardness. (C) 2001 Elsevier Science B.V. All rights
reserved.