Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering

Authors
Bailey, P Skeldon, P Noakes, TCQ Thompson, GE Sakairi, M Habazaki, H Shimizu, K
Citation
P. Bailey et al., Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering, SURF INT AN, 31(6), 2001, pp. 480-483
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
31
Issue
6
Year of publication
2001
Pages
480 - 483
Database
ISI
SICI code
0142-2421(200106)31:6<480:CASOEA>2.0.ZU;2-4
Abstract
The topmost 20 nm of an electropolished Al-1 at.% Cu alloy has been investi gated at sub-nanometre resolution using medium-energy ion scattering. Diffe rences in the composition and depth of the enriched Cu layer are observed. Most significantly, the enriched layer contains regions of differing struct ure and/or lattice orientation with Cu atoms located in distinct ordered re gions, consist ent with the presence of Cu-rich clusters, Surface-segregate d Si and Cu are observed and CI and Cu are found in the oxide. Copyright (C ) 2001 John Wiley & Sons, Ltd.