Pk. Appelblad et al., Sources of uncertainty in isotope ratio measurements by inductively coupled plasma mass spectrometry, ANALYT CHEM, 73(13), 2001, pp. 2911-2919
A model is presented describing the effects of dead time and mass bias corr
ection factor uncertainties, flicker noise, and counting statistics on isot
ope ratio measurement precision using inductively coupled plasma mass spect
rometry (ICPMS) with a single collector. Noise spectral analysis is exploit
ed to enable estimation of the flicker noise parameters. For the instrument
used, the flicker noise component exhibited a fairly weak frequency (f) de
pendence (proportional to f (-0.33 +/-0.12)), but was directly proportional
to the total number of counts, Q. As white noise, determined by counting s
tatistics, is given by Q(0.5), the isotope ratio measurement uncertainties
will actually cease to improve when Q exceeds a certain threshold. This wou
ld suggest that flicker noise could become the limiting factor for the prec
ision with which isotope ratios can be determined by ICPMS, However, under
most experimental conditions, uncertainties associated with mass discrimina
tion and dead time correction factors are decisive. For ratios up to simila
r to 22 (In-115/In-113), optimum major isotope count rates are generally be
low 0.3 MHz, for which precision in the mass discrimination factor is limit
ing. The model derived could be used as a starting point for determining op
timum conditions and understanding the limitations of single-collector ICPM
S for precise isotope ratio measurements.