Carrier relaxation dynamics for As defects in GaN

Citation
B. Gil et al., Carrier relaxation dynamics for As defects in GaN, APPL PHYS L, 79(1), 2001, pp. 69-71
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
1
Year of publication
2001
Pages
69 - 71
Database
ISI
SICI code
0003-6951(20010702)79:1<69:CRDFAD>2.0.ZU;2-Z
Abstract
Long decay times in the 50-150 ns range have been measured for the characte ristic blue photoluminescence that peaks at 2.6 eV in GaN:As. We interpret these long decay times according to the theoretical predictions that this b lue photoluminescence is caused by the incorporation of arsenic on the gall ium site. The long decay times are characteristics of the large lattice rel axation for such a deep donor with a negative-U center behavior. (C) 2001 A merican Institute of Physics.