Cm. Fetzer et al., Spectroscopic study of surfactant enhanced organometallic vapor phase epitaxy growth of GaInP, J APPL PHYS, 90(2), 2001, pp. 1040-1046
Samples of GaxIn1-xP grown by organometallic vapor phase epitaxy on (001) G
aAs substrates by addition of TESb demonstrating a lateral superlattice com
positional modulation (CM) have been studied by low temperature polarized p
hotoluminescence (PL), power dependent PL, and photoluminescence excitation
(PLE) spectroscopy. Strong polarization is observed in the low temperature
PL and PLE spectra at Sb concentrations below that where CuPtB ordering is
removed and triple period ordering is produced. Low temperature polarized
PL is shown to be the most sensitive optical technique for detecting the pr
esence of CM. The radiative recombination mechanism at low temperature is e
xcitonic, originating from the exponential tail of band gap states observed
in the PLE spectra. From the measured band gaps, a continuum model of the
band structure allows an estimate of an upper limit of the percent modulati
on present in the samples. Above Sb/III(v)=0.01, compositional modulation i
s the dominant factor determining the low temperature optical properties. T
he percent fluctuation of composition increases monotonically with increasi
ng Sb during growth. (C) 2001 American Institute of Physics.