Novel structure GaAs/InGaAS/AlGaAs pseudomorphic MODFETs with a p i-n dipol
e buried layer and a 200 nm buffer layer have been fabricated with molecula
r beam epitaxy and regular wet etching processing technology. The measured
transconductance of these MODFETs, with a gate length of 2 mum and a drain-
source spacing of 5 mum, are as high as 320 mS/mm. The measured maximum dra
in currents of the typical devices are higher than 500 mA/mm. As far as we
know, these represent the best results ever reported for MODFETs with simil
ar scales (C) 2001 Elsevier Science B.V. All rights reserved.