(AlAs)(m)/(GaP)(n) short-period superlattices with (m, n) = (3, 3), (2, 3),
(1,4) were grown on (0 0 1) GaAs substrates by gas-source migration-enhanc
ed epitaxy at 400<^>C. The formation of the structures was confirmed by X-r
ay diffraction measurements and cross-sectional transmission electron micro
scopy analysis. A broad emission in the photoluminescence spectra was obser
ved at approximately 550 560 nm in all the samples at low temperature. Tile
origin of the peaks of the (AlAs)(3)/(GaP)(3) and (AlAs)(2)/(GaP)(3) sampl
es was considered to be either the localization state or the energy band re
flecting the zone-folding and band-mixing effect of the superlattices, whil
e the peak of the (AlAs)(1)/(GaP)(4) sample was ascribed to defects in the
layer or heterointerface roughness. (C) 2001 Elsevier Science B.V. All righ
ts reserved.