We report on molecular beam epitaxial growth and structural characterisatio
ns of unintentionally-doped InAs/AlSb strained multiple quantum wells grown
on GaSb substrates. The crystalline quality and the interface roughness ob
tained using different cell shutter sequences at the arsenide/antimonide in
terfaces are compared by high resolution X-ray diffraction and small angle
X-ray reflectivity measurements. Optical characterisations by photo-induced
absorption spectroscopy are then carried out. A strong e1 --> e2 p-polaris
ed intersubband absorption is observed in the mid infrared with a narrow br
oadening factor, revealing the good material quality of the sampler. (C) 20
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