Growth and characterization of InMnAsSb for the sensor-memory device application at long wavelength region

Citation
Yk. Zhou et al., Growth and characterization of InMnAsSb for the sensor-memory device application at long wavelength region, J CRYST GR, 227, 2001, pp. 614-618
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
227
Year of publication
2001
Pages
614 - 618
Database
ISI
SICI code
0022-0248(200107)227:<614:GACOIF>2.0.ZU;2-V
Abstract
A new diluted magnetic III-V semiconductor In1-xMnxAs1-ySby was grown by me talorganic molecular beam epitaxy. Raman scattering measurements were perfo rmed on InMnAs samples. The recorded spectra showed coupled LO phonon-plasm on mode. The behavior of this coupled LO phonon-plasmon mode indicated that InMnAs layers are p-type. The light-induced ferromagnetic order was confir med in the InMnAs layers and was observed, fur the first time, in the InMnA sSb/InSb heterostructures under the irradiation of long wavelength (> 2 mum ) light. The results are explained in terms of hole accumulation in the InM nAsSb layer, which enhances the ferromagnetic spill exchange among Mn ions. The sample with InMnAsSb layer grown on InSb at 250 degreesC showed larger ferromagnetic order than that Brown at 280 degreesC. (C) 2001 Elsevier Sci ence B.V. All rights reserved.