Auger parameter shift and extra-atomic-relaxation of ZnS1-xTex alloys

Auger parameter shifts of Zn and Te as a function of composition of 3 relat ively unexplored semi-insulator ZnS1-xTex alloy system were studied using X -ray photoelectron spectroscopy (XPS). A model based on the concept of rela xation is used to explain the polarization change of this alloy system due to the existence of the two core holes left in the Auger process. To comple ment this theoretical model, the dielectric constants of ZnS1-xTex alloys a s a function of composition were measured using a structure similar to a pa rallel plate capacitor. The Auger parameter shifts calculated from this mod el are in good agreement with that obtained from the XPS measurement. (C) 2 001 Elsevier Science B.V. All rights reserved.