Laser molecular beam epitaxy and characterization of perovskite oxide thinfilms

Citation
Gz. Yang et al., Laser molecular beam epitaxy and characterization of perovskite oxide thinfilms, J CRYST GR, 227, 2001, pp. 929-935
Citations number
9
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
227
Year of publication
2001
Pages
929 - 935
Database
ISI
SICI code
0022-0248(200107)227:<929:LMBEAC>2.0.ZU;2-R
Abstract
More than 10 kinds of perovskite oxide thin films and their heterostructure s have been successfully fabricated on SrTiO3(STO) (0 0 1) substrates by la ser molecular beam epitaxy (laser MBE). Measurements of atomic force micros copy (AFM) and high-rt solution transmission electron microscopy (HRTEM) re veal that the surfaces and interfaces are Atom level smooth. The unit cell layers and the lattice structure are perfect. The enhancement of secund-har monic generation (SHG) in BaTiO3/SrTiO3 9BTO/STO) superlattices and the thi ckness dependent structural characteristics of BaTiO3 (BTO) thin fillns wer e observed. The all-prrovskite oxide P-N junctions have been successfully f abricated and better I-V curves were observed. (C) 2001 Elsevier Science B. V. All rights reserved.